MICROTEST 2kN & 5kN modules have been specifically designed to allow real time observation of the high stress region of a sample with an SEM, optical microscope, AFM or XRD system. Windows 7.0/10.0 software sets drive parameters and displays the stress/strain curve live on the computer screen. Loadcells from 150N to 5kN cover most applications, with extension rates from 0.005mm/min to 50mm/min. All stages have linear scales for elongation measurement and optical encoders for speed control. Options include three and four point bending clamps, fibre clamps and microscope mounting adaptors. Modules are controlled from Microtest tensile testing software and special versions can be manufactured to customers requirements.

The Deben Coolstage can also be used for high vacuum heating and cooling applications inside the SEM. The Deben Coolstage is available for all SEMs and guaranteed temperature range is +50°C to -25°C (at 300Pa chamber pressure) or less than -30°C at higher vacuums.

The dual leadscrew stage has been designed to allow both transmitted and reflected illumination and can be fitted to an optical microscope, XRD system or Synchrotron. Supplied with feet the stage can stand vertically like a conventional tensile tester or with the feet removed it will sit flat on a bench or optical microscope stage. Versions with maximum loading to 2kN or 5kN are available, with optional loadcells of 500N and 1kN. Sample clamps are removable allowing easy customisation and the fitting of special clamps for different samples. We can supply fibre clamps, three and four point bending clamps and clamps to hold specifically shaped specimens. Optionally the stage can be supplied with temperature controllers and either heated or heated and cooled specimen clamps with a variable temperature range of -150˚C to 550˚C.

In association with the major manufacturers µXCT systems including Zeiss, RX Solutions, Tescan/XRE, Nikon, Thermo Fisher Scientific and Waygate/GE we are now able to offer an integrated tensile testing solution for your µXCT application. Using tensile testing with µXCT provides a clear visual interpretation of how the properties of materials and composites change under different loading conditions. The compact design of these testing stages allow them to be used with the smallest high resolution micro CT systems providing a range of tensile, compression and torsion stages with forces up to 20kN and resolutions down to 25mN. Systems are controlled from the comprehensive MICROTEST tensile stage control software giving a wide range of control functions and a live display of load versus extension and supplied with all required cabling and mounting adaptors for specific µXCT systems. Further details and pricing is available from your micro CT supplier or direct from Tansi.

Deben can supply a range of different stages for Bi-axial and Quad-axial tensile testing. Whatever your requirements Deben have a solution for your application, we have a standard 2kN stage and can manufacture other custom systems with different forces from 50N up to 100kN.

Deben have recently developed a new 2KN tensile stage with optional heating to 600°C specifically for use within an SEM with EBSD detector fitted. The stage has dual sample clamps allowing sample observation at 0° and 70° and can be fitted with optional heating/cooling jaws with temperature range up to 600°C.

A low-cost 3½-digit liquid crystal display readout of Electron Beam Probe Current. The free-standing meter is battery powered and measures from below 1pA to 2μA in 5 switched ranges. The meter has automatic zero correction but there may be small residual error not exceeding 5pA at 25°C. Where absolute readings are required on low ranges this small error may be subtracted from the reading obtained.

The motorised unit completely replaces the existing final aperture assembly and utilises the existing aperture strip. The system comprises a precision motorised mechanical assembly, drive electronics and keypad controller.

Deben can supply a TV chamberscope for your SEM using an internally or externally mounted high resolution camera with infra-red illumination. The chamberscope can be mounted on any available free port, even one not directly in line with the centre of the column. There is a choice of wide or narrow angle lenses which are user interchangable. Systems are available with or without monitors and with optional USB control and image display. Deben chamberscopes are available for most SEM models, contact us for a quotation and to check compatibility on your SEM.

The Deben PCD Beam Blanker has been designed to provide JEOL and Hitachi FEG, LaB6 and tungsten SEMs with the capability of blanking, pulsing or otherwise modulating the electron beam. The blanking unit utilises the PCD port on the side of the column (opposite the final aperture) and will operate at up to 30KV with a switch on/off time of approximately 50nS. There is an integral faraday cup and probe current detector for an indication of probe current. A BNC connector is provided for connection to an optional probe current meter should a more accurate reading be required.

The comparison stage is designed to accept the most common bullets and cartridge cases and allows two samples to be mounted side by side for detailed comparison. Each sample can be independently rotated through 360 degrees and their relative heights adjusted.

In association with the major manufacturers µXCT systems including Zeiss, RX Solutions, Tescan/XRE, Nikon, Thermo Fisher Scientific and Waygate/GE we are now able to offer an integrated tensile testing solution for your µXCT application. Using tensile testing with µXCT provides a clear visual interpretation of how the properties of materials and composites change under different loading conditions. The compact design of these testing stages allow them to be used with the smallest high resolution micro CT systems providing a range of tensile and compression stages with forces up to 20kN and resolutions down to 25mN. Systems are controlled from the comprehensive MICROTEST tensile stage control software giving a wide range of control functions and a live display of load versus extension and supplied with all required cabling and mounting adaptors for specific µXCT systems. Further details and pricing is available from your micro CT supplier or direct from Tansi.

The Deben peltier stage for µXCT tomography systems allows samples to be imaged in a frozen condition, a dual layer polystyrene (optional carbon) window prevents icing and allows samples to be rapidly cooled to ‐20°C. A variable height specimen holder allows samples to be placed at the optimum height for X‐Ray imaging and mounting adaptors are available for a range of µXCT stages. The cooling system is self contained and does not require an additional water chiller, pipes are flexible and easily allow 360° rotation.

MICROTEST three point bending and tensile/compression modules have been specifically designed to observe the high stress region of the sample within a SEM or under an optical microscope. Windows software sets drive parameters and displays the stress/strain curve live on the PC screen. Loadcells from 75N to 2kN cover most applications, with extension rates from 0.05mm/min to 5mm/min. Special versions can be manufactured to customers requirements. All modules are controlled from Microtest tensile testing software.

MICROTEST 200N modules have been specifically designed to allow real time observation of the high stress region of a sample with an SEM, optical microscope, AFM or XRD system. Windows 7.0/10.0 software sets drive parameters and displays the stress/strain curve live on the computer screen. Loadcells from 2N to 200N cover most applications, with extension rates from 0.1mm/min to 15mm/min. All stages have linear scales for elongation measurement and optical encoders for speed control. Options include three and four point bending clamps, fibre clamps and microscope mounting adaptors. All modules are controlled from our Microtest tensile testing software and special versions can be manufactured to customers requirements.