inCiTe™3D X-Ray Microscope
The high conversion efficiency of the a-Se detector enables very high-speed sampling at low X-ray radiation doses. Owing to the high efficiency, unprecedented volumetric scan speed can be obtained at full resolution.
In addition, the inCiTe™ 3D X-ray Microscope is designed with patented propagation-based, phase-contrast imaging to enhance detail of the f ine structures that are typically X-ray transparent, without losses associated with grating-based phase contrast systems.
Moreover, the inCiTe™ 3D X-ray Microscope is equipped with a high-quality micro-focus X-ray source to achieve unparalleled resolution. Integrated software controls and simplified user interface en able a high degree of automation and reduce opera tor dependence. The size and weight of the inCiTe™ 3D X-ray Microscope are designed for minimum foot print, ease of transportation, and convenient integra tion into laboratory benchtop stations. The novel 3D X-ray Microscope features efficient, high-resolution X-ray imaging in a compact benchtop system.
EXCLUSIVE AMORPHOUS SELENIUM (A-SE) DETECTOR
A unique combination of high spatial resolution and detection efficiency
PHASE CONTRAST TECHNOLOGY
Phase contrast technology for superior contrast
BETTER VISUALIZATION OF LOW-DENSITY MATERIALS
Excellent visualization of biomaterials, polymer composites and other low-density materials
PATENTED TECHNOLOGY
Learn how our technology works.
Nanjing Tansi Technology Co.,Ltd.
TEL: 025-85432178, 85432278
ADD:2-728b, Hongqiao center, new City Plaza, 281 Zhongshan North Road, Nanjing. ZIP:210009
E-mail:sales@tansi.com.cn
Tansi Beijing Branch
TEL: 010-62908712
ADD:Rm 719, Jinrongkemao Building, Shangdi 3rd Street, Haidian District, Beijing. ZIP:100085
WebSite:en.tansi.com.cn
© 2024 tansi.com.cn Copyright 苏ICP备05020058号