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inCiTe™3D X-Ray Microscope

inCiTe™3D X-Ray Microscope

The inCiTe™ 3D X-ray Microscope provides phase contrast imaging and micro-CT capabilities from KA Imaging, and is the first commercial X-ray CT system that utilizes BrillianSe™, a patented high spatial resolution amorphous selenium (a-Se) detector technology exclusively developed by KA Imaging. High spatial resolution and detection efficiency of BrillianSe™ X-ray detector enables rapid phase contrast imaging and conventional micro-CT in a convenient benchtop system. Fields that can benefit from this technology include non-destructive testing (NDT), additive manufacturing, electronics, agriculture, geology, preclinical imaging, and specimen radiography. High spatial resolution and detection efficiency of BrillianSe™ X-ray detector enables rapid phase contrast imaging and conventional micro-CT in a convenient benchtop system.
BrillianSe™ X-Ray Detector

BrillianSe™ X-Ray Detector

The patented amorphous selenium (a-Se) BrillianSe X-ray detector is designed for high-brilliance imaging. The hybrid a-Se/CMOS detector uses an a-Se photoconductor with high intrinsic spatial resolution for direct conversion of X-ray photons to electric charge. The electronic signal is then read out by a low noise CMOS active pixel sensor (APS). Without the need to first convert X-ray photons to visible light, as in indirect scintillator-based approaches, thinning of the conversion layer to minimize optical scatter is not necessary. BrillianSe™ provides a unique combination of high spatial resolution using 8 μm pixels, and high Detective Quantum Efficiency (DQE) for energies up to 110 keV. This combination enables efficient imaging at low flux and high energy, as well as propagation-based (grating less) in-line phase-contrast enhancement for improved sensitivity when imaging low-density materials.
REVEAL™ R 35C X-Ray Detector

REVEAL™ R 35C X-Ray Detector

Reveal™ R 35C is capable of generating three types of images: traditional DR,low-density and high-density materials. This single exposure eliminates the motion artifact problemobserved in traditional dual-energy systems thatrequire two exposures. The detector’s unique energyfeatures can be customized simply through softwaresettings to distinguish various types of high and lowdensity materials. 
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