PP3005 SEMCool Non-Airlock Cooling System for SEM and FIB/SEM
The SEMCool is based on the PP3006 CoolLok but without the airlock components. It is designed for cryogenic applications where airlock exchange of specimens into the microscope is not required.
Key features
• Temperature range down to -190°C
• Off-column cooling with all-day runtime between fills
• Independent cooling of cold stage and cold trap
• Upgrade path to PP3006 CoolLok
A highly stable and thermally isolated nitrogen gas-cooled cold stage attaches to the SEM stage. The location and shape of the cold trap is tailored to suit the internal geometry of the SEM. Both cold stage and cold trap are capable of reaching temperatures down to -190°C.
The cold stage connects to the SEM stage using an adaptor and has a dovetail fitting to accept a cryo specimen holder. When not in use the cold stage is uncoupled and stored within the chamber with the gas and electrical fittings connected.
The SEM (or FIB/SEM) is vented and the specimen/specimen holder is manually located on the cold stage. The microscope is pumped down and the SEMCool cooled to the required working temperature. To exchange specimen warm the cold stage to above 0°C and vent the SEM. This product is for Research Use Only
The cold stage and cold trap are cooled by a floor-mounted, vacuum isolated dewar and heat exchanger assembly which at normal operating temperatures can run for up to 24 hours between fills. The gas lines between the dewar and the SEM interface are vacuum isolated for maximum thermal efficiency. The cooling dewar is located on a floor-mounted trolley which also houses the temperature and gas control system.
The SEMCool requires a rotary pump to periodically evacuate the vacuum isolated lines.
The PP3005 is only recommended for applications where infrequent exchanges of specimens is expected. For greater specimen throughput an airlock into the SEM or FIB/SEM is essential. For these applications please see: PP3006 CoolLok and PP3010 Cryo Preparation System. Looking for transferring ambient temperature specimens into SEM, FIB/SEM or other suitable vacuum systems? Please see: PP3004 QuickLok.
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